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6H N Type SiC Wafer, Dummy Grade,2”Size -SiC Wafer Supplier

XIAMEN POWERWAY ADVANCED MATERIAL CO., LTD.
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    Buy cheap 6H N Type SiC Wafer, Dummy Grade,2”Size -SiC Wafer Supplier from wholesalers
     
    Buy cheap 6H N Type SiC Wafer, Dummy Grade,2”Size -SiC Wafer Supplier from wholesalers
    • Buy cheap 6H N Type SiC Wafer, Dummy Grade,2”Size -SiC Wafer Supplier from wholesalers

    6H N Type SiC Wafer, Dummy Grade,2”Size -SiC Wafer Supplier

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    Brand Name : PAM-XIAMEN
    Price : By Case
    Payment Terms : T/T
    Supply Ability : 10,000 wafers/month
    Delivery Time : 5-50 working days
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    6H N Type SiC Wafer, Dummy Grade,2”Size -SiC Wafer Supplier


    6H N Type SiC Wafer, Dummy Grade,2”Size -SiC Wafer Supplier


    PAM-XIAMEN offers semiconductor silicon carbide wafers,6H SiC and 4H SiC in different quality grades for researcher and industry manufacturers. We has developed SiC crystal growth technology and SiC crystal wafer processing technology,established a production line to manufacturer SiCsubstrate,Which is applied in GaNepitaxydevice,powerdevices,high-temperature device and optoelectronic Devices. As a professional company invested by the leading manufacturers from the fields of advanced and high-tech material research and state institutes and China’s Semiconductor Lab,weare devoted to continuously improve the quality of currently substrates and develop large size substrates.

    Here shows detail specification


    SILICON CARBIDE MATERIAL PROPERTIES


    PolytypeSingle Crystal 4HSingle Crystal 6H
    Lattice Parametersa=3.076 Åa=3.073 Å
    c=10.053 Åc=15.117 Å
    Stacking SequenceABCBABCACB
    Band-gap3.26 eV3.03 eV
    Density3.21 · 103 kg/m33.21 · 103 kg/m3
    Therm. Expansion Coefficient4-5×10-6/K4-5×10-6/K
    Refraction Indexno = 2.719no = 2.707
    ne = 2.777ne = 2.755
    Dielectric Constant9.69.66
    Thermal Conductivity490 W/mK490 W/mK
    Break-Down Electrical Field2-4 · 108 V/m2-4 · 108 V/m
    Saturation Drift Velocity2.0 · 105 m/s2.0 · 105 m/s
    Electron Mobility800 cm2/V·S400 cm2/V·S
    hole Mobility115 cm2/V·S90 cm2/V·S
    Mohs Hardness~9~9

    6H N Type SiC Wafer, Dummy Grade,2”Size


    SUBSTRATE PROPERTYS6H-51-N-PWAM-250 S6H-51-N-PWAM-330 S6H-51-N-PWAM-430
    DescriptionDummy Grade 6H SiC Substrate
    Polytype6H
    Diameter(50.8 ± 0.38) mm
    Thickness(250 ± 25) μm (330 ± 25) μm (430 ± 25) μm
    Carrier Typen-type
    DopantNitrogen
    Resistivity (RT)0.02 ~ 0.1 Ω·cm
    Surface Roughness< 0.5 nm (Si-face CMP Epi-ready); <1 nm (C- face Optical polish)
    FWHM<50 arcsec
    Micropipe DensityA+≤1cm-2 A≤10cm-2 B≤30cm-2 C≤50cm-2 D≤100cm-2
    Surface Orientation
    On axis<0001>± 0.5°
    Off axis3.5° toward <11-20>± 0.5°
    Primary flat orientationParallel {1-100} ± 5°
    Primary flat length16.00 ± 1.70 mm
    Secondary flat orientationSi-face:90° cw. from orientation flat ± 5°
    C-face:90° ccw. from orientation flat ± 5°
    Secondary flat length8.00 ± 1.70 mm
    Surface FinishSingle or double face polished
    PackagingSingle wafer box or multi wafer box
    Usable area≥ 90 %
    Edge exclusion1 mm

    Single crystal SiC Properties

    Here we compare property of Silicon Carbide, including Hexagonal SiC,CubicSiC,Single crystal SiC.

    Property of Silicon Carbide (SiC)

    Comparision of Property of Silicon Carbide, including Hexagonal SiC,Cubic SiC,Single crystal SiC:

    PropertyValueConditions
    Density3217 kg/m^3hexagonal
    Density3210 kg/m^3cubic
    Density3200 kg/m^3Single crystal
    Hardness,Knoop(KH)2960 kg/mm/mm100g,Ceramic,black
    Hardness,Knoop(KH)2745 kg/mm/mm100g,Ceramic,green
    Hardness,Knoop(KH)2480 kg/mm/mmSingle crystal.
    Young's Modulus700 GPaSingle crystal.
    Young's Modulus410.47 GPaCeramic,density=3120 kg/m/m/m, at room temperature
    Young's Modulus401.38 GPaCeramic,density=3128 kg/m/m/m, at room temperature
    Thermal conductivity350 W/m/KSingle crystal.
    Yield strength21 GPaSingle crystal.
    Heat capacity1.46 J/mol/KCeramic,at temp=1550 C.
    Heat capacity1.38 J/mol/KCeramic,at temp=1350 C.
    Heat capacity1.34 J/mol/KCeramic,at temp=1200 C.
    Heat capacity1.25 J/mol/KCeramic,at temp=1000 C.
    Heat capacity1.13 J/mol/KCeramic,at temp=700 C.
    Heat capacity1.09 J/mol/KCeramic,at temp=540 C.
    Electrical resistivity1 .. 1e+10 Ω*mCeramic,at temp=20 C
    Compressive strength0.5655 .. 1.3793 GPaCeramic,at temp=25 C
    Modulus of Rupture0.2897 GPaCeramic,with 1 wt% B addictive
    Modulus of Rupture0.1862 GPaCeramifc,at room temperature
    Poisson's Ratio0.183 .. 0.192Ceramic,at room temperature,density=3128 kg/m/m/m
    Modulus of Rupture0.1724 GPaCeramic,at temp=1300 C
    Modulus of Rupture0.1034 GPaCeramic,at temp=1800 C
    Modulus of Rupture0.07586 GPaCeramic,at temp=1400 C
    Tensile strength0.03448 .. 0.1379 GPaCeramic,at temp=25 C

    *Reference:CRC Materials Science and Engineering Handbook


    Comparision of Property of single crystal SiC, 6H and 4H:

    PropertySingle Crystal 4HSingle Crystal 6H
    Lattice Parametersa=3.076 Åa=3.073 Å
    c=10.053 Åc=15.117 Å
    Stacking SequenceABCBABCACB
    Band-gap3.26 eV3.03 eV
    Density3.21 · 103 kg/m33.21 · 103 kg/m3
    Therm. Expansion Coefficient4-5×10-6/K4-5×10-6/K
    Refraction Indexno = 2.719no = 2.707
    ne = 2.777ne = 2.755
    Dielectric Constant9.69.66
    Thermal Conductivity490 W/mK490 W/mK
    Break-Down Electrical Field2-4 · 108 V/m2-4 · 108 V/m
    Saturation Drift Velocity2.0 · 105 m/s2.0 · 105 m/s
    Electron Mobility800 cm2/V·S400 cm2/V·S
    hole Mobility115 cm2/V·S90 cm2/V·S
    Mohs Hardness~9~9

    *Reference:Xiamen Powerway Advanced Material Co.,Ltd.


    Comparision of property of 3C-SiC,4H-SiC and 6H-SiC:

    Si-C Polytype3C-SiC4H-SiC6H-SiC
    Crystal structureZinc blende (cubic)Wurtzite ( Hexagonal)Wurtzite ( Hexagonal)
    Group of symmetryT2d-F43mC46v-P63mcC46v-P63mc
    Bulk modulus2.5 x 1012 dyn cm-22.2 x 1012 dyn cm-22.2 x 1012 dyn cm-2
    Linear thermal expansion coefficient2.77 (42) x 10-6 K-1  
    Debye temperature1200 K1300 K1200 K
    Melting point3103 (40) K3103 ± 40 K3103 ± 40 K
    Density3.166 g cm-33.21 g cm-33.211 g cm-3
    Hardness9.2-9.39.2-9.39.2-9.3
    Surface microhardness2900-3100 kg mm-22900-3100 kg mm-22900-3100 kg mm-2
    Dielectric constant (static)ε0 ~= 9.72The value of 6H-SiC dielectric constant is usually usedε0,ort ~= 9.66
    Infrared refractive index~=2.55~=2.55 (c axis)~=2.55 (c axis)
    Refractive index n(λ)n(λ)~= 2.55378 + 3.417 x 104·λ-2n0(λ)~= 2.5610 + 3.4 x 104·λ-2n0(λ)~= 2.55531 + 3.34 x 104·λ-2
    ne(λ)~= 2.6041 + 3.75 x 104·λ-2ne(λ)~= 2.5852 + 3.68 x 104·λ-2
    Radiative recombination coefficient1.5 x 10-12 cm3/s1.5 x 10-12 cm3/s
    Optical photon energy102.8 meV104.2 meV104.2 meV
    Effective electron mass (longitudinal)ml0.68mo0.677(15)mo0.29mo
    Effective electron mass (transverse)mt0.25mo0.247(11)mo0.42mo
    Effective mass of density of states mcd0.72mo0.77mo2.34mo
    Effective mass of the density of states in one valley of conduction band mc0.35mo0.37mo0.71mo
    Effective mass of conductivity mcc0.32mo0.36mo0.57mo
    Effective hall mass of density of state mv?0.6 mo~1.0 mo~1.0 mo
    Lattice constanta=4.3596 Aa = 3.0730 Aa = 3.0730 A
    b = 10.053b = 10.053

    *Reference: IOFFE

    SiC 4H and SiC 6H manufacturer reference:PAM-XIAMEN is the world’s leading developer of solid-state lighting technology,he offer a full line: Sinlge crystal SiC wafer and epitaxial wafer and SiC wafer reclaim.


    Thermal Expansion Coefficient:


    Thermal expansion is the tendency of matter to change in volume in response to a change in temperature.
    When a substance is heated, its particles begin moving more and thus usually maintain a greater average separation. Materials which contract with increasing temperature are rare; this effect is limited in size, and only occurs within limited temperature ranges (see examples below). The degree of expansion divided by the change in temperature is called the material's coefficient of thermal expansion and generally varies with temperature.

    The coefficient of thermal expansion describes how the size of an object changes with a change in temperature. Specifically, it measures the fractional change in size per degree change in temperature at a constant pressure. Several types of coefficients have been developed: volumetric, area, and linear. Which is used depends on the particular application and which dimensions are considered important. For solids, one might only be concerned with the change along a length, or over some area.
    The volumetric thermal expansion coefficient is the most basic thermal expansion coefficient. In general, substances expand or contract when their temperature changes, with expansion or contraction occurring in all directions. Substances that expand at the same rate in every direction are called isotropic. For isotropic materials, the area and linear coefficients may be calculated from the volumetric coefficient.

    Mathematical definitions of these coefficients are defined below for solids, liquids, and gasses.

    General volumetric thermal expansion coefficient In the general case of a gas, liquid, or solid, the volumetric coefficient of thermal expansion is given by

    The subscript p indicates that the pressure is held constant during the expansion, and the subscript "V" stresses that it is the volumetric (not linear) expansion that enters this general definition. In the case of a gas, the fact that the pressure is held constant is important, because the volume of a gas will vary appreciably with pressure as well as temperature. For a gas of low density this can be seen from the ideal gas law.


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