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Brand Name : | PAM-XIAMEN |
Price : | By Case |
Payment Terms : | T/T |
Supply Ability : | 10,000 wafers/month |
Delivery Time : | 5-50 working days |
4H Semi-insulating Silicon Substrate , Dummy Grade ,10mm x 10mm with High Thermal Conductivity
PAM-XIAMEN provides high quality single crystal SiC (Silicon Carbide)waferfor electronic and optoelectronic industry. SiC wafer is a next generation semiconductor materialwith unique electrical properties and excellent thermal properties for high temperature and high power device application. SiC wafer can be supplied in diameter 2~6 inch, both 4H and 6H SiC , N-type , Nitrogen doped , and semi-insulating type available.
Please contact us for more information
SILICON CARBIDE MATERIAL PROPERTIES
Polytype | Single Crystal 4H | Single Crystal 6H |
Lattice Parameters | a=3.076 Å | a=3.073 Å |
c=10.053 Å | c=15.117 Å | |
Stacking Sequence | ABCB | ABCACB |
Band-gap | 3.26 eV | 3.03 eV |
Density | 3.21 · 103 kg/m3 | 3.21 · 103 kg/m3 |
Therm. Expansion Coefficient | 4-5×10-6/K | 4-5×10-6/K |
Refraction Index | no = 2.719 | no = 2.707 |
ne = 2.777 | ne = 2.755 | |
Dielectric Constant | 9.6 | 9.66 |
Thermal Conductivity | 490 W/mK | 490 W/mK |
Break-Down Electrical Field | 2-4 · 108 V/m | 2-4 · 108 V/m |
Saturation Drift Velocity | 2.0 · 105 m/s | 2.0 · 105 m/s |
Electron Mobility | 800 cm2/V·S | 400 cm2/V·S |
hole Mobility | 115 cm2/V·S | 90 cm2/V·S |
Mohs Hardness | ~9 | ~9 |
4H Semi-Insulating Silicon Substrate, Dummy Grade,10mm x 10mm
SUBSTRATE PROPERTY | S4H-51-SI-PWAM-250 S4H-51-SI-PWAM-330 S4H-51-SI-PWAM-430 |
Description | Dummy Grade 4H SEMI Substrate |
Polytype | 4H |
Diameter | (50.8 ± 0.38) mm |
Thickness | (250 ± 25) μm (330 ± 25) μm (430 ± 25) μm |
Resistivity (RT) | >1E5 Ω·cm |
Surface Roughness | < 0.5 nm (Si-face CMP Epi-ready); <1 nm (C- face Optical polish) |
FWHM | <50 arcsec |
Micropipe Density | A+≤1cm-2 A≤10cm-2 B≤30cm-2 C≤50cm-2 D≤100cm-2 |
Surface Orientation | |
On axis <0001>± 0.5° | |
Off axis 3.5° toward <11-20>± 0.5° | |
Primary flat orientation | Parallel {1-100} ± 5° |
Primary flat length | 16.00 ± 1.70 mm |
Secondary flat orientation Si-face:90° cw. from orientation flat ± 5° | |
C-face:90° ccw. from orientation flat ± 5° | |
Secondary flat length | 8.00 ± 1.70 mm |
Surface Finish | Single or double face polished |
Packaging | Single wafer box or multi wafer box |
Usable area | ≥ 90 % |
Edge exclusion | 1 mm |
FAQ:
Question: This time we would buy SiC wafers for a MEMS application where high thermal conductivity is desired. Nominally, we are looking to purchase 20, 100mm wafers. However, we are flexible. They can be either conductive or semi-insulating, 4H or 6H. Whichever product has the highest thermal conductivity would be preferred. We would also be interested in odd stock that you may have available. 50 mm, 75mm, and 150mm wafers would also be acceptable depending on the price and lead time
Answer:We ever measured it, 4H semi-insulating is the best one, which thermal conductivity is highest.
SiC crystal application
Many researchers know the general SiCapplication:III-V Nitride Deposition;OptoelectronicDevices;High Power Devices;High Temperature Devices;High Frequency Power Devices.But few people knows detail applications, We list some detail application and make some explanations.
Detail Application of Silicon Carbide
Because of SiC physical and electronic properties,silicon carbide
based device are well suitable for short wavelength optoelectronic,
high temperature, radiation resistant, and
high-power/high-frequency electronic devices,compared with Si and
GaAs based device.
Many researchers know the general SiC application:III-V Nitride
Deposition;Optoelectronic Devices;High Power Devices;High
Temperature Devices;High Frequency Power Devices.But few people
knows detail applications, here we list some detail application and
make some explanations:
1. SiC substrate for X-ray monochromators:such as,using SiC's large
d-spacing of about 15 A;
2. SiC substrate for high voltage devices;
3. SiC substrate for diamond film growth by microwave
plasma-enhanced chemical vapor deposition;
4. For silicon carbide p-n diode;
5. SiC substrate for optical window: such as for very short (<
100 fs) and intense (> 100 GW/cm2) laser pulses with a
wavelength of 1300 nm. It should have a low absorption coefficient
and a low two photon absorption coefficient for 1300 nm.
6. SiC substrate for heat spreader: For example,the Silicon carbide
crystal will be capillary bonded on a flat gain chip surface of
VECSEL (Laser) to remove the generated pump heat. Therefore, the
following properties are important:
1) Semi-insulating type required to prevent free carrier absorption of the laser light;
2) Double side polished are preferred;
3) Surface roughness: < 2nm, so that the surface is enough flat for bonding;
7. SiC substrate for THz system application: Normally it require THz transparency
8. SiC substrate for epitaxial graphene on SiC:Graphene epitaxy on off axis substrate and on axis are both available, surface side on C-face or Si face are both available.
9. SiC substrate for process development loke ginding, dicing and etc
10. SiC substrate for fast photo-electric switch
11. SiC substrate for heat sink: thermal conductivity and thermal expansion are concerned.
12. SiC substrate for laser: optical, surface and stranparence are concerned.
13. SiC substrate for III-V epitaxy, normally off axis substrate are required.
Xiamen Powerway Advanced Material Co.,Limited is an expert in SiC substrate, he can give researchers suggestions in different application
Saturation Velocity:
Saturation velocity is the maximum velocity a charge carrier in a
semiconductor, generally an electron, attains in the presence of
very high electric fields[1]. Charge carriersnormally move at an
average drift speed proportional to the electric field strength
they experience temporally. The proportionality constant is known
as mobility of the carrier, which is a material property. A good
conductor would have a high mobility value for its charge carrier,
which means higher velocity, and consequently higher current values
for a given electric field strength. There is a limit though to
this process and at some high field value, a charge carrier can not
move any faster, having reached its saturation velocity, due to
mechanisms that eventually limit the movement of the carriers in
the material.
When designing semiconductor devices, especially on a sub-micrometre scale as used in modern microprocessors, velocity saturation is an important design characteristic.
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