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Indium arsenide wafer by LEC as epi ready or mechanical grade with n type p type or semi insulating in different orient

XIAMEN POWERWAY ADVANCED MATERIAL CO., LTD.
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    Buy cheap Indium arsenide wafer by LEC as epi ready or mechanical grade with n type p type or semi insulating in different orient from wholesalers
     
    Buy cheap Indium arsenide wafer by LEC as epi ready or mechanical grade with n type p type or semi insulating in different orient from wholesalers
    • Buy cheap Indium arsenide wafer by LEC as epi ready or mechanical grade with n type p type or semi insulating in different orient from wholesalers

    Indium arsenide wafer by LEC as epi ready or mechanical grade with n type p type or semi insulating in different orient

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    Brand Name : PAM-XIAMEN
    Price : By Case
    Payment Terms : T/T
    Supply Ability : 10,000 wafers/month
    Delivery Time : 5-50 working days
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    Indium arsenide wafer by LEC as epi ready or mechanical grade with n type p type or semi insulating in different orient

    Indium arsenide wafer by LEC as epi-ready or mechanical grade with n type, p type or semi-insulating in different orient

    PAM-XIAMEN offers Compound Semiconductor InAs wafer - Indium arsenide which are grown by LEC(Liquid Encapsulated Czochralski) as epi-ready or mechanical grade with n type, p type or semi-insulating in different orientation(111)or(100).

    Indium arsenide, InAs, is a semiconductor composed of indium and arsenic. It has the appearance of grey cubic crystals with a melting point of 942 °C. Indium arsenide is used for construction of infrared detectors, for the wavelength range of 1–3.8 µm. The detectors are usually photovoltaic photodiodes. Cryogenically cooled detectors have lower noise, but InAs detectors can be used in higher-power applications at room temperature as well. Indium arsenide is also used for making of diode lasers.

    Indium arsenide is similar to gallium arsenide and is a direct bandgap material. Indium arsenide is sometimes used together with indium phosphide. Alloyed with gallium arsenide it forms indium gallium arsenide - a material with band gap dependent on In/Ga ratio, a method principally similar to alloying indium nitridewith gallium nitride to yield indium gallium nitride.

    Here is the detail specification:

    2"(50.8mm)InAs Wafer Specification

    3"(76.2mm)InAs Wafer Specification

    4"(100mm)InAs Wafer Specification

    2" InAs Wafer Specification

    ItemSpecifications
    DopantUndopedStannumSulphurZinc
    Conduction TypeN-typeN-typeN-typeP-type
    Wafer Diameter2"
    Wafer Orientation(100)±0.5°
    Wafer Thickness500±25um
    Primary Flat Length16±2mm
    Secondary Flat Length8±1mm
    Carrier Concentration5x1016cm-3(5-20)x1017cm-3(1-10)x1017cm-3(1-10)x1017cm-3
    Mobility2x104cm2/V.s7000-20000cm2/V.s6000-20000cm2/V.s100-400cm2/V.s
    EPD<5x104cm-2<5x104cm-2<3x104cm-2<3x104cm-2
    TTV<10um
    BOW<10um
    WARP<12um
    Laser markingupon request
    Suface finishP/E, P/P
    Epi readyyes
    PackageSingle wafer container or cassette

    3" InAs Wafer Specification

    ItemSpecifications
    DopantUndopedStannumSulphurZinc
    Conduction TypeN-typeN-typeN-typeP-type
    Wafer Diameter3"
    Wafer Orientation(100)±0.5°
    Wafer Thickness600±25um
    Primary Flat Length22±2mm
    Secondary Flat Length11±1mm
    Carrier Concentration5x1016cm-3(5-20)x1017cm-3(1-10)x1017cm-3(1-10)x1017cm-3
    Mobility2x104cm2/V.s7000-20000cm2/V.s6000-20000cm2/V.s100-400cm2/V.s
    EPD<5x104cm-2<5x104cm-2<3x104cm-2<3x104cm-2
    TTV<12um
    BOW<12um
    WARP<15um
    Laser markingupon request
    Suface finishP/E, P/P
    Epi readyyes
    PackageSingle wafer container or cassette


    4" InAs Wafer Specification

    ItemSpecifications
    DopantUndopedStannumSulphurZinc
    Conduction TypeN-typeN-typeN-typeP-type
    Wafer Diameter4"
    Wafer Orientation(100)±0.5°
    Wafer Thickness900±25um
    Primary Flat Length16±2mm
    Secondary Flat Length8±1mm
    Carrier Concentration5x1016cm-3(5-20)x1017cm-3(1-10)x1017cm-3(1-10)x1017cm-3
    Mobility2x104cm2/V.s7000-20000cm2/V.s6000-20000cm2/V.s100-400cm2/V.s
    EPD<5x104cm-2<5x104cm-2<3x104cm-2<3x104cm-2
    TTV<15um
    BOW<15um
    WARP<20um
    Laser markingupon request
    Suface finishP/E, P/P
    Epi readyyes
    PackageSingle wafer container or cassette

    Indium arsenide wafer by LEC as epi ready or mechanical grade with n type p type or semi insulating in different orient

    1)2”(50.8mm)InAs
    Type/Dopant:N/S
    Orientation:[111B]±0.5°
    Thickness:500±25um
    Epi-Ready
    SSP

    2)2”(50.8mm)InAs
    Type/Dopant:N/Undoped
    Orientation : (111)B
    Thickness:500um±25um
    SSP

    3)2”(50.8mm)InAs
    Type/Dopant:N Un-doped
    Orientation : <111>A ±0.5°
    Thickness:500um±25um
    epi-ready
    Ra<=0.5nm
    Carrier Concentration(cm-3):1E16~3E16
    Mobility(cm -2 ):>20000
    EPD(cm -2 ):<15000
    SSP

    4)2”(50.8mm)InAs
    Type/Dopant:N/Undoped
    Orientation : <100> with [001]O.F.
    Thickness:2mm
    AS cut

    5)2”(50.8mm)InAs
    Type/Dopant:N/P
    Orientation :(100),
    Carrier Concentration(cm-3):(5-10)E17,
    Thickness:500 um
    SSP

    All wafers are offered with high quality epitaxy ready finishing. Surfaces are characterised by in-house, advanced optical metrology techniques which include Surfscan haze and particle monitoring, spectroscopic ellipsometry and grazing incidence interferometry

    The influence of annealing temperature on the optical properties of surface electron accumulation layers in n-type (1 0 0) InAs wafers has been investigated by Raman spectroscopy. It exhibits that Raman peaks due to scattering by unscreened LO phonons disappear with increasing temperature, which indicates that the electron accumulation layer in InAs surface is eliminated by annealing. The involved mechanism was analyzed by X-ray photoelectron spectroscopy, X-ray diffraction and high-resolution transmission electron microscopy. The results show that amorphous In2O3 and As2O3 phases are formed at InAs surface during annealing and, meanwhile, a thin crystalline As layer at the interface between the oxidized layer and the wafer is also generated which leads to a decrease in thickness of the surface electron accumulation layer since As adatoms introduce acceptor type surface states.

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